Ying Shi, Ph.D. is a Research Scientist in the Accelerated Methodologies Group, where she leads the X-ray Characterization Laboratory. The lab is equipped with three powder X-ray diffraction (XRD) systems, a single-crystal XRD, and two X-ray fluorescence (XRF) instruments. Her research centers on developing advanced characterization approaches that link synthesis conditions to material structure, properties, and performance. She also utilizes neutron and synchrotron beamlines to access structural information beyond the capabilities of in-house techniques.

Shi has extensive experience using X-ray, electron, and neutron-based methods to study materials at the atomic scale. Her research goal is to translate detailed structural insights into a deeper understanding of materials functionality.

Shi earned her Ph.D. in condensed matter physics from the Institute of Physics at the Chinese Academy of Sciences and holds both M.S. and B.S. degrees from Northwestern Polytechnical University in China.